Počet záznamů: 1
Atomic force microscopy and atomic force acoustic microscopy characterization of photo-induced changes in some Ge-As-S amorphous films
- 1.Knotek, P. - Tichý, Ladislav
Atomic force microscopy and atomic force acoustic microscopy characterization of photo-induced changes in some Ge-As-S amorphous films.
Thin Solid Films. Roč. 517, č. 5 (2009), s. 1837-1840. ISSN 0040-6090. E-ISSN 1879-2731
Impakt faktor: 1.727, rok: 2009
http://hdl.handle.net/11104/0169011
Počet záznamů: 1