Crystal structure and magnetic properties of UO.sub.2./sub./permalloy thin films

0455195 - FZÚ 2016 RIV CH eng J - Článek v odborném periodiku
Tereshina, Evgeniya - Daniš, S. - Springell, R. - Bao, Z. - Havela, L. - Caciuffo, R.
Crystal structure and magnetic properties of UO₂/permalloy thin films.
Thin Solid Films. Roč. 591, Sep (2015), s. 271-275. ISSN 0040-6090. E-ISSN 1879-2731
Grant CEP: GA ČR GP13-25866P
Institucionální podpora: RVO:68378271
Klíčová slova: exchange bias * permalloy * uranium dioxide
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 1.761, rok: 2015

The exchange bias effect was studied on antiferromagnetic-ferromagnetic UO2/permalloy (Ni80Fe20) thin films. Films with a fixed thickness of UO2 layer and variable thickness of the covering Ni80Fe20 layer have been grown by reactive sputter deposition. The X-ray diffraction study showed epitaxial growth of the UO2 layer on (100) CaF2 substrates and a polycrystalline permalloy layer on top of it. The samples exhibited perpendicular exchange bias with the maximum magnitude of 22 mT found in UO2/Ni80Fe20 with the thinnest permalloy of 177 A.
Trvalý link: http://hdl.handle.net/11104/0255835