Slow-neutron-induced charged-particle emission-channeling-measurements with Medipix detectors

0365538 - ÚJF 2012 RIV NL eng J - Článek v odborném periodiku
Koster, U. - Granja, C. - Jakubek, J. - Uher, J. - Vacík, Jiří
Slow-neutron-induced charged-particle emission-channeling-measurements with Medipix detectors.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 633, č. 1 (2011), S267-S269. ISSN 0168-9002. E-ISSN 1872-9576.
[11th International Workshop on Radiation Imaging Detectors. Praha, 28.06.2009-02.07.2009]
Výzkumný záměr: CEZ:AV0Z10480505
Klíčová slova: Emission channeling * Neutron induced reaction
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače
Impakt faktor: 1.207, rok: 2011

The lattice location of helium, lithium, beryllium, boron or sodium host or impurity atoms in single crystals can be studied by slow-neutron-induced charged particle emission channeling measurements. Modern silicon pixel detectors can cover an entire emission channeling pattern in a single measurement and allow reviving this technique for practical applications. We report on the use of the TimePix detector for such emission channeling experiments with samples containing (6)Li, (7)Be or (10)B. (C) 2010 Elsevier B.V. All rights reserved.
Trvalý link: http://hdl.handle.net/11104/0200762