Microstructure of creep-exposed single crystal nickel base superalloy CSMX4

0358067 - ÚJF 2011 RIV GB eng C - Konferenční příspěvek (zahraniční konf.)
Strunz, Pavel - Zrnik, J. - Epishin, A. - Link, T. - Balog, S.
Microstructure of creep-exposed single crystal nickel base superalloy CSMX4.
Journal of Physics: Conference Series. Institute of Physics Publishing, Roč. 247, - (2010), 012039/1-012039/7. ISSN 1742-6588. E-ISSN 1742-6596.
[XIV International Conference on Small-Angle Scattering. Oxford (GB), 13.09.2009-18.09.2009]
Výzkumný záměr: CEZ:AV0Z10480505
Klíčová slova: CSMX4
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače

Main changes which appear in microstructure of Ni base superalloys during creep exposure is the directional coarsening (rafting) of originally cubic γ' precipitates embedded in γ matrix. The progress in γ' degradation can be assessed with help of the analysis of geometrical parameters of the γ' microstructure. Determination of the morphological changes of γ' in creep-exposed single-crystal Ni-base superalloy CMSX4 using SANS was carried out. A new sample design (conic specimen) was tested in order to get continually changing stress levels in one sample and corresponding variety of micro structural change. Evolution of rafts with stress magnitude is clearly observable from the parameters obtained using SANS (the mean thickness of the γ channel in different crystallographic directions of the single-crystal, the evolution of the γ' precipitate size and distance, the evolution of the specific interface).
Trvalý link: http://hdl.handle.net/11104/0196205