Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO.sub.2./sub. nanoparticles

0349618 - FZÚ 2011 RIV GB eng J - Článek v odborném periodiku
Suzuki-Muresan, T. - Deniard, P. - Gautron, E. - Petříček, Václav - Jobic, S. - Grambow, B.
Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO₂ nanoparticles.
Journal of Applied Crystallography. Roč. 43, Part 5 (2010), 1092-1099. ISSN 0021-8898. E-ISSN 1600-5767
Výzkumný záměr: CEZ:AV0Z10100521
Klíčová slova: x-ray diffraction * Rietveld refinement * nanoparticles
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 3.794, rok: 2010

Monoclinic and tetragonal zirconia samples were characterized by X-ray diffraction, pycnometry, thermogravimetric analysis (TGA), Fourier transform (FT) IR and mass (MS) spectroscopies, and scanning and transmission electron (TEM) microscopies. The results show, for the particular case of a tetragonal zirconia sample, an X-ray-undetected subproduct identified as an amorphous organic phase by FTIR–ATR (attenuated total reflection) and TGA–MS. The observations by TEM allowed this amorphous phase to be localized on the surface as a shell coating the nanoparticles. Moreover, this amorphous phase was quantified by Rietveld refinement via the addition of an internal silicon standard.
Trvalý link: http://hdl.handle.net/11104/0006108