Počet záznamů: 1
Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I
- 1.0488135 - FZÚ 2018 RIV GB eng J - Článek v odborném periodiku
Kohn, V.G. - Khikhlukha, Danila
Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I.
Acta Crystallographica Section A-Foundation and Advances. Roč. 72, May (2016), s. 349-356. ISSN 2053-2733. E-ISSN 2053-2733
Grant CEP: GA MŠMT EF15_008/0000162; GA MŠMT ED1.1.00/02.0061
Grant ostatní: ELI Beamlines(XE) CZ.02.1.01/0.0/0.0/15_008/0000162; ELI Beamlines(XE) CZ.1.05/1.1.00/02.0061
Institucionální podpora: RVO:68378271
Klíčová slova: X-ray diffraction * silicon crystal * six-beam diffraction * section topography * computer simulations
Obor OECD: Fluids and plasma physics (including surface physics)
Impakt faktor: 5.725, rok: 2016
Trvalý link: http://hdl.handle.net/11104/0282752
Počet záznamů: 1