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SHIM and TPEM: Getting More Information from Non Linear Excitation
- 1.Bianchini, P., Vicidomini, G., Mondal, P. P., Ramoino, P., Usai, C., Janáček, J., Kubínová, L., Diaspro, A. SHIM and TPEM: Getting More Information from Non Linear Excitation. In: Focus on Microscopy. Valencia: University of Valencia, 2007, s. 136-136.
Počet záznamů: 1