Počet záznamů: 1  

About the information depth of backscattered electron imaging

  1. 1.
    Piňos, J., Mikmeková, Š., Frank, L. About the information depth of backscattered electron imaging. Journal of Microscopy. 2017, 266(3), 335-342. ISSN 0022-2720. Dostupné z: doi: 10.1111/jmi.12542