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Simulations and measurements in scanning electron microscopes at low electron energy
- 1.WALKER, C., FRANK, L., MÜLLEROVÁ, I. Simulations and measurements in scanning electron microscopes at low electron energy. Scanning. 2016, 38(6), 802-818. ISSN 0161-0457. E-ISSN 1932-8745. Dostupné z: doi: 10.1002/sca.21330
Počet záznamů: 1