Počet záznamů: 1
In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires
- 1.MALARD, B., PILCH, J., ŠITTNER, P., DELVILLE, R., CURFS, C. In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires. Solid State Phenomena. 2011, 172-174(6), 1243-1248. ISSN 1012-0394. Dostupné z: doi: 10.4028/www.scientific.net/SSP.172-174.1243
Počet záznamů: 1