Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment

LINDGREN, S., AFFOLDER, A.A., ALLPORT, P.P., BATES, R., BETANCOURT, C., BÖHM, J., BROWN, H., BUTTAR, C., CARTER, J. R., CASSE, G., MIKEŠTÍKOVÁ, M. Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment. Nuclear Instruments & Methods in Physics Research Section A. 2011, 636(1), "S111"-"S117". ISSN 0168-9002. E-ISSN 1872-9576. Dostupné z: doi: 10.1016/j.nima.2010.04.094.