XUV Emission from Autoionizing Hole States Induced by Intense XUV-FEL at Intensities up to 1017 W/cm.sup.2./sup..

ROSMEJ, F.B., GALTIER, E., RILEY, D., DZELZAINIS, T., HEINMANN, P., KHATTAK, F.Y., LEE, W., NAGLER, B., NELSON, A., TSCHENTSCHER, T., VINKO, S.M., WHITCHER, T., TOLEIKIS, S., FÄUSTLIN, R., SOBERIERSKI, R., JUHA, L., FAJARDO, M., WARK, J. S., CHALUPSKÝ, J., HÁJKOVÁ, V., KRZYWINSKI, J., JUREK, M., KOZLOVÁ, M. XUV Emission from Autoionizing Hole States Induced by Intense XUV-FEL at Intensities up to 1017 W/cm². Journal of Physics: Conference Series. 2010, 244(4), 1-4. ISSN 1742-6588. E-ISSN 1742-6596. Dostupné z: doi: 10.1088/1742-6596/244/4/042028