Exchange bias of a ferromagnetic semiconductor by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry

OLEJNÍK, K., WADLEY, P., HAIGH, J.A., EDMONDS, K. W., CAMPION, R. P., RUSHFORTH, A.W., GALLAGHER, B. L., FOXON, C. T., JUNGWIRTH, T., WUNDERLICH, J., DHESI, S.S., CAVILL, S.A., VAN DER LAAN, G., ARENHOLZ, E. Exchange bias of a ferromagnetic semiconductor by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry. Physical Review. B. 2010, 81(10), 104402/1-104402/5. ISSN 1098-0121. Dostupné z: doi: 10.1103/PhysRevB.81.104402