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Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources
- 1.KRÁSA, J., LÁSKA, L., ROHLENA, K., VELYHAN, A., CZARNECKA, A., PARYS, P., RYC, L., WOLOWSKI, J. Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources. Radiation Effects and Defects in Solids. 2010, 165(6-10), 441-450. ISSN 1042-0150. E-ISSN 1029-4953. Dostupné z: doi: 10.1080/10420151003718402
Počet záznamů: 1