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Examination of Very Thin Free-standing Films with Slow Electrons
- 1.MÜLLEROVÁ, I., HOVORKA, M., FRANK, L. Examination of Very Thin Free-standing Films with Slow Electrons. In: Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 45-48. ISBN 978-4-9903248-2-7.
Počet záznamů: 1