3D characterization of material structure using scanning electron microscopy (SEM) and focused ion beam (FIB)

HRADILOVÁ, M., JÄGER, A., LEJČEK, P. 3D characterization of material structure using scanning electron microscopy (SEM) and focused ion beam (FIB). In: Metal 2010 - 19th international conference on metallurgy and materials. Ostrava: Tanger s.r.o, 2010, s. 152-153. ISBN 978-80-87294-15-4.