Imaging of thermal treated thin films on silicon substrate in the scanning low energy electron microscope

ZOBAČOVÁ, J., MIKMEKOVÁ, Š., POLČÁK, J., FRANK, L. Imaging of thermal treated thin films on silicon substrate in the scanning low energy electron microscope. In: MIKA, F., ed. Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, s. 69-70. ISBN 978-80-254-6842-5.