A high resolution x-ray spectrometer utilizing Kirkpatrick-Baez optics and off-plane gratings

MCENTAFFER, R.L., HUDEC, R., MURRAY, N.J., HOLLAND, A.D. A high resolution x-ray spectrometer utilizing Kirkpatrick-Baez optics and off-plane gratings. In: HUDEC, R., PINA, L., eds. EUV and X-Ray Optics: Synergy between Laboratory and Space. Bellingham: SPIE, 2009, 736014-1-736014-10. Proceedings of SPIE, 7360. ISBN 9780819476340. ISSN 0277-786X.