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Profiling of N-Type Dopants in Silicon Based Structures
- 1.HOVORKA, M., MIKA, F., FRANK, L., MIKULÍK, P. Profiling of N-Type Dopants in Silicon Based Structures. In: POKORNÁ, Zuzana, MIKA, Filip, eds. Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009, s. 14. ISBN 978-80-254-4535-8.
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