Počet záznamů: 1

Profiling of N-type dopants in silicon structures

  1. 1.
    Hovorka, M.; Mika, F.; Frank, L. Profiling of N-type dopants in silicon structures. In MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy Graz: Verlag der Technischen Universität, 2009, Vol. 1: 181-182. ISBN 978-3-85125-062-6. [MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./, Graz, 30.08.2009-04.09.2009, AT]. Dostupný z: <http://www.univie.ac.at/asem/Graz_MC_09/papers/19923.pdf http://www.univie.ac.at/asem/Graz_MC_09/papers/19923.pdf>.