Počet záznamů: 1
Atomic force microscopy and atomic force acoustic microscopy characterization of photo-induced changes in some Ge-As-S amorphous films
- 1.KNOTEK, P., TICHÝ, L. Atomic force microscopy and atomic force acoustic microscopy characterization of photo-induced changes in some Ge-As-S amorphous films. Thin Solid Films. 2009, 517(5), 1837-1840. ISSN 0040-6090. E-ISSN 1879-2731. Dostupné z: doi: 10.1016/j.tsf.2008.09.041
Počet záznamů: 1