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Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System
- 1.FRANK, L., ZADRAŽIL, M., MÜLLEROVÁ, I. Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System. Scanning. 2001, 23(1), 36-50. ISSN 0161-0457. E-ISSN 1932-8745.
Počet záznamů: 1