Fast infrared thermography on the COMPASS tokamak.

0481820 - ÚFP 2018 RIV CH eng J - Článek v odborném periodiku
Vondráček, Petr - Gauthier, C. - Ficker, Ondřej - Hron, Martin - Imríšek, Martin - Pánek, Radomír
Fast infrared thermography on the COMPASS tokamak.
Fusion Engineering and Design. Roč. 123, November (2017), s. 764-767. ISSN 0920-3796. E-ISSN 1873-7196.
[SOFT 2016: Symposium on Fusion Technology /29./. Prague, 05.09.2016-09.09.2016]
Grant CEP: GA MŠMT(CZ) 8D15001; GA MŠMT(CZ) LM2015045; GA ČR(CZ) GA15-10723S
GRANT EU: European Commission(XE) 633053 - EUROfusion
Institucionální podpora: RVO:61389021
Klíčová slova: Infrared thermography * Heat flux decay length * Runaway electrons * Sawtooth
Obor OECD: Nuclear related engineering
Impakt faktor: 1.437, rok: 2017
http://www.sciencedirect.com/science/article/pii/S0920379617305392

A new fast infrared camera was purchased on the COMPASS tokamak recently. It is equipped with a medium wavelength infrared (3-5 mm) InSb detector and is capable of reaching framerate up to 1.9 kHz in full frame acquisition mode (320 x 256 px.) and up to 90 kHz in sub-windowed mode (64 x 4 px.).
First experimental measurements of plasma heat flux to inner and outer wall limiters of the COMPASS tokamak using the new camera are presented. Time evolution of parallel heat flux during sawtooth instability is studied showing strong modulation of the heat flux absolute value whilst keeping constant its radial decay length. Fast modulation of outboard midplane limiter heat loading due to runaway electrons is also presented.
The camera will be part of a new fast divertor thermographic system with exceptional spatial resolution (similar to 0.6-1.3 mm/px. on the target plane, 0.04-0.14 mmipx. mapped to the outer midplane) with a possibility of measurements of radial profiles on the divertor with 320 x 4 px. with temporal resolution better than 20 mu s. A design of the foreseen optical divertor system is described together with a design of a special divertor graphite tile used for the IR thermography, that will allow in-situ surface emissivity calibration.
Trvalý link: http://hdl.handle.net/11104/0277629