Počet záznamů: 1  

Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl

  1. 1.
    Kopeček, Jaromír, Jurek, Karel, Kopecký, Vít, Klimša, Ladislav, Seiner, Hanuš, Sedlák, Petr, Landa, Michal, Dluhoš, J., Petrenec, M., Hladík, L., Doupal, A., Heczko, Oleg. Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl. Microscopy and Microanalysis. 2014, 20(Aug), 335-336. ISSN 1431-9276. Dostupné z: doi: 10.1017/S1431927614003390