Comparing different approaches to characterization of focused X-ray laser beams

0361433 - FZÚ 2012 RIV NL eng J - Článek v odborném periodiku
Chalupský, Jaromír - Boháček, Pavel - Hájková, Věra - Hau-Riege, S.P. - Heimann, P.A. - Juha, Libor - Krzywinski, J. - Messerschmidt, M. - Moeller, S.P. - Nagler, B. - Rowen, M. - Schlotter, W.F. - Swiggers, M.L. - Turner, J.J.
Comparing different approaches to characterization of focused X-ray laser beams.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 631, č. 1 (2011), s. 130-133. ISSN 0168-9002. E-ISSN 1872-9576
Grant CEP: GA AV ČR KAN300100702; GA MŠMT LC510; GA MŠMT(CZ) LC528; GA ČR GAP208/10/2302; GA MŠMT LA08024; GA AV ČR IAAX00100903; GA MŠMT(CZ) ME10046
Výzkumný záměr: CEZ:AV0Z10100523
Klíčová slova: X-ray laser * X-ray ablation * beam focusing * beam characterization * beam profile measurement
Kód oboru RIV: BH - Optika, masery a lasery
Impakt faktor: 1.207, rok: 2011

X-ray lasers represent a powerful tool to explore matter under extreme conditions. A rigorous characterization of their output parameters is, therefore, of substantial importance for the purposes of the experiments being conducted at these sources. A profound knowledge of the spatial, temporal, spectral, statistical, coherence, and wavefront beam properties may protect us from an unwanted misinterpretation of the experimental data. We present an experimental technique of the spatial (transverse and longitudinal) characterization of the beam profile. Investigating ablative imprints in various materials, we evaluate the spatial properties of the incident beam, namely, the beam waist radius and position, the Rayleigh range, M-2 parameter, and divergence. In this paper, we recall briefly our recent work at the transverse beam profile reconstruction. A newly developed method of the longitudinal beam profile characterization is the main subject of this work.
Trvalý link: http://hdl.handle.net/11104/0198745