Application of FIB technique to study of early fatigue damage in polycrystals

0353531 - ÚFM 2011 RIV GB eng J - Článek v odborném periodiku
Man, Jiří - Weidner, A. - Kuběna, Ivo - Vystavěl, T. - Skrotzki, W. - Polák, Jaroslav
Application of FIB technique to study of early fatigue damage in polycrystals.
Journal of Physics: Conference Series. Roč. 240, - (2010), 012058. ISSN 1742-6588. E-ISSN 1742-6596.
[ICSMA-15 (15th International Conference on the Strength of Materials). Dresden, 16.08.2009-21.08.2009]
Grant CEP: GA AV ČR 1QS200410502; GA ČR GA101/07/1500; GA ČR GA106/06/1096
Výzkumný záměr: CEZ:AV0Z20410507
Klíčová slova: focused ion beam (FIB) * persistent slip band (PSB) * fatigue crack initiation
Kód oboru RIV: JL - Únava materiálu a lomová mechanika

Focused ion beam (FIB) technique together with other advanced microscopic techniques were applied to study early microstructural changes leading to crack initiation in fatigued polycrystals. Dislocation structures of persistent slip bands (PSBs) and surrounding matrix were revealed in the bulk of surface grains by electron channelling contrast imaging (ECCI) technique on the FIB cross-sections. True shape of extrusions, intrusions and the path of initiated fatigue cracks were assessed in three dimensions by serial FIB cross-sectioning (FIB tomography). Advantageous potential of FIB technique and its other possible utilization in fatigue crack initiation studies in polycrystals are highlighted.
Trvalý link: http://hdl.handle.net/11104/0192763