Počet záznamů: 1
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon
- 1.0354945 - FZÚ 2011 RIV CH eng J - Článek v odborném periodiku
Verveniotis, Elisseos - Rezek, Bohuslav - Šípek, Emil - Stuchlík, Jiří - Kočka, Jan
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon.
Thin Solid Films. Roč. 518, č. 21 (2010), s. 5965-5970. ISSN 0040-6090. E-ISSN 1879-2731
Grant CEP: GA ČR GD202/09/H041; GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510
Výzkumný záměr: CEZ:AV0Z10100521
Klíčová slova: amorphous materials * atomic force microscopy (AFM) * conductivity * crystallization * nanostructures * silicon * nickel
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 1.909, rok: 2010
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon. Various types of conductive tips in atomic force microscope (AFM) are used to localize field-enhanced metal-induced solid phase crystallization (FE-MISPC) of amorphous silicon at room temperature down to nanoscale dimensions.
Trvalý link: http://hdl.handle.net/11104/0193834
Počet záznamů: 1