Počet záznamů: 1
Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation
- 1.0539468 - ÚJF 2022 RIV GB eng J - Článek v odborném periodiku
Mikšová, Romana - Jagerová, Adéla - Malinský, Petr - Harcuba, P. - Veselý, J. - Holý, V. - Kentsch, U. - Macková, Anna
Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation.
Vacuum. Roč. 184, FEB (2021), č. článku 109773. ISSN 0042-207X. E-ISSN 1879-2715
Grant CEP: GA MŠMT LM2015056; GA ČR GA18-03346S
Institucionální podpora: RVO:61389005
Klíčová slova: Ag-ion implantation * Yttria-stabilised zirconia * damage accumulation * strain relaxation * nanoparticles
Obor OECD: Materials engineering
Impakt faktor: 4.110, rok: 2021 ; AIS: 0.477, rok: 2021
Způsob publikování: Omezený přístup
Web výsledku:
https://doi.org/10.1016/j.vacuum.2020.109773DOI: https://doi.org/10.1016/j.vacuum.2020.109773
The paper reports on implantation damage accumulation, Ag distribution and the interior morphology in different crystallographic orientations of implanted samples of cubic yttria-stabilised zirconia (YSZ). (100)-, (110)- and (111)-oriented YSZ was implanted with 400-keV Ag+ ions at ion fluences from 5 x 10(14) to 5 x 10(16) cm(-2). Rutherford backscattering spectrometry (RBS) in the channelling mode (RBS-C), as well as X-ray diffraction (XRD), were used for the quantitative measurement of the lattice disorder and Ag distribution. The defect propagation and Ag accumulation were observed using transmission electron microscopy (TEM) with the energy-dispersive X-ray spectroscopy (EDX). Although similar damage evolution trends were observed along with all channelling directions, the disorder accumulation is lower along the 110 direction than along the 100 and 111 direction. The damage extends much deeper than the theoretically predicted depths. It is attributed to long-range defect migration effects, confirmed by TEM. At the ion fluence of 5 x 10(16) cm(-2), nanometre-sized Ag precipitates were identified in the depth of 30-130 nm based on the Ag concentration-depth profiles determined by RBS.
Trvalý link: http://hdl.handle.net/11104/0317204
Počet záznamů: 1