Walker, C. - Frank, Luděk - Müllerová, Ilona
Simulations and measurements in scanning electron microscopes at low electron energy.
Scanning. Roč. 38, č. 6 (2016), s. 802-818. ISSN 0161-0457. E-ISSN 1932-8745
Grant CEP: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Impakt faktor: 1.345, rok: 2016 ; AIS: 0.399, rok: 2016
DOI: https://doi.org/10.1002/sca.21330
http://hdl.handle.net/11104/0265392