Počet záznamů: 1
Mechanism of high-resolution STM/AFM imaging with functionalized tips
- 1.0432397 - FZÚ 2015 RIV US eng J - Článek v odborném periodiku
Hapala, Prokop - Kichin, G. - Wagner, C. - Tautz, F.S. - Temirov, R. - Jelínek, Pavel
Mechanism of high-resolution STM/AFM imaging with functionalized tips.
Physical Review. B. Roč. 90, č. 8 (2014), "085421-1"-"085421-9". ISSN 1098-0121. E-ISSN 2469-9969
Grant CEP: GA ČR(CZ) GC14-16963J
Grant ostatní: AVČR(CZ) M100101207
Institucionální podpora: RVO:68378271
Klíčová slova: AFM * STM * high resolution
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 3.736, rok: 2014
High-resolution atomic force microscopy (AFM) and scanning tunneling microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing.We present a numerical STM/AFM model, which takes into account the relaxation of the probe due to the tip-sample interaction.
Trvalý link: http://hdl.handle.net/11104/0236765
Počet záznamů: 1