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Computer control of photoluminescence spectrometer used for characterization of semiconductors
- 1.KOSTKA, F., ZAVADIL, J., KRECHLER, J., DVOŘÁK, M., SVATUŠKA, M., GLADKOV, P. Computer control of photoluminescence spectrometer used for characterization of semiconductors. Pilsen: University of West Bohemia, 2003. ISBN 80-7082-951-6. In: PINKER, J., ed. Applied Electronics 2003. , s. 123-128.
Počet záznamů: 1