Počet záznamů: 1
Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope with InAs as based electrode
- 1.VANIŠ, J., CHOW, D. H., PANGRÁC, J., ŠROUBEK, F., MCGILL, T. C., WALACHOVÁ, J. Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope with InAs as based electrode. Physica Status Solidi C. 2003, 0(3), 986-991. ISSN 1610-1634.
Počet záznamů: 1
