Zavadil, Jiří - Procházková, Olga - Žďánský, Karel
Rare earth elements in semiconductors. Characterization-Part II.
Beijing: [Institute of Semiconductors, Chinese Academy of Sciences], 1999. In: Proceedings The Second Chinese-Czech Symposium Advenced Materials and Devices for Optoelectronics. - (Yu, J.), s. 100-105
[Chinese-Czech Symposium Advanced Materials and Devices for Optoelectronics /2./. Beijing (CN), 13.09.1999-14.09.1999]
Grant CEP: GA ČR GA102/99/0341
Grant ostatní: AV ČR(CZ) KSK1010601 Projekt 7/96/K:4074
http://hdl.handle.net/11104/0113694