Švorčík, V. - Tichá, H. - Rybka, V. - Hnatowicz, Vladimír
Characterization of polymeric films by ellipsometry.
Journal of Materials Science Letters. Roč. 19, - (2000), s. 679-681. ISSN 0261-8028
Impakt faktor: 0.496, rok: 2000
http://hdl.handle.net/11104/0081465