0183407 - UJF-V 940077 RIV CZ eng J - Článek v odborném periodiku
Strunz, Pavel - Lukáš, Petr - Mikula, Pavol - Šaroun, Jan - Albertini, G. - Rustichelli, F. - Cicognani, G. - di Gianfrancesco, A.
Characterization of the greep exposed CMSX2 single crystal by neutron diffraction topography and neutron diffractometry.
Czechoslovak Journal of Physics. Roč. 44, - (1994), s. 687-693. ISSN 0011-4626
Grant CEP: GA AV ČR IAA148404; GA ČR GA202/93/0361
Impakt faktor: 0.330, rok: 1994
Trvalý link: http://hdl.handle.net/11104/0001961