Atomic Surface Characterization and Modification of the Layered Compounds Bi.sub.2./sub.Se.sub.3./sub., Bi.sub.1.9./sub.Sb.sub.0.1./sub.Se.sub.3./sub. and Bi.sub.1.6./sub.Sb.sub.0.4./sub.Se.sub.3./sub..

Name: Atomic Surface Characterization and Modification of the Layered Compounds Bi.sub.2./sub.Se.sub.3./sub., Bi.sub.1.9./sub.Sb.sub.0.1./sub.Se.sub.3./sub. and Bi.sub.1.6./sub.Sb.sub.0.4./sub.Se.sub.3./sub..
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Contera, S. A.; Yoshinobu, T.; Iwasaki, H.; Bastl, Zdeněk; Lošták, P.

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Atomic Surface Characterization and Modification of the Layered Compounds Bi.sub.2./sub.Se.sub.3./sub., Bi.sub.1.9./sub.Sb.sub.0.1./sub.Se.sub.3./sub. and Bi.sub.1.6./sub.Sb.sub.0.4./sub.Se.sub.3./sub..

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Contera, S. A. - Yoshinobu, T. - Iwasaki, H. - Bastl, Zdeněk - Lošták, P.
Atomic Surface Characterization and Modification of the Layered Compounds Bi₂Se₃, Bi_1.9Sb_0.1Se₃ and Bi_1.6Sb_0.4Se₃.
Ultramicroscopy. Roč. 86, č. 1 (2001), s. 55-61. ISSN 0304-3991. E-ISSN 1879-2723
Grant ostatní: MESSC(JP) 09CE2005
Impakt faktor: 1.890, rok: 2001
http://hdl.handle.net/11104/0077708

Počet záznamů: 1