Zemek, Josef - Jiříček, Petr - Hucek, Stanislav - Lesiak, B. - Jablonski, A.
Measurements of escape probability of photoelectrons and the inelastic mean free path in silver sulphide.
Surface and Interface Analysis. Roč. 30, - (2000), s. 222-227. ISSN 0142-2421. E-ISSN 1096-9918
Grant ostatní: GAUK(CZ) 1051-10/733
Impakt faktor: 1.215, rok: 2000
http://hdl.handle.net/11104/0032538