Shaginyan, L. R. - Mišina, Martin - Zemek, Josef - Musil, Jindřich - Regent, F. - Britun, V. F.
Composition, structure, microhardness and residual stress of W-Ti-N films deposited by reactive magnetron sputtering.
Thin Solid Films. Roč. 408, - (2002), s. 136-147. ISSN 0040-6090. E-ISSN 1879-2731
Grant CEP: GA ČR GV106/96/K245; GA ČR GA106/99/D086
Impakt faktor: 1.443, rok: 2002
http://hdl.handle.net/11104/0031719