Počet záznamů: 1
Composition, structure, microhardness and residual stress of W-Ti-N films deposited by reactive magnetron sputtering
- 1.SHAGINYAN, L. R., MIŠINA, Martin, ZEMEK, Josef, MUSIL, Jindřich, REGENT, F., BRITUN, V. F. Composition, structure, microhardness and residual stress of W-Ti-N films deposited by reactive magnetron sputtering. Thin Solid Films. 2002, 408(-), 136-147. ISSN 0040-6090. E-ISSN 1879-2731.
Počet záznamů: 1