Jablonski, A. - Zemek, Josef - Jiříček, Petr
Elastic electron backscattering from overlayer/substrate systems.
Surface and Interface Analysis. Roč. 31, - (2001), s. 825-834. ISSN 0142-2421. E-ISSN 1096-9918
Impact factor: 0.987, year: 2001
http://hdl.handle.net/11104/0031399