0133408 - FZU-D 20010258 RIV DK eng J - Článek v odborném periodiku
Artemiev, Nikolai - Busetto, E. - Hrdý, Jaromír - Pacherová, Oliva - Snigirev, A. - Suvorov, A.
X-ray diffraction on Si single crystal with a W-shaped longitudinal groove.
Journal of Synchrotron Radiation. Roč. 7, - (2000), s. 382-385. ISSN 0909-0495. E-ISSN 1600-5775
Grant CEP: GA MŠMT OK 305; GA MPO PZ-CH/22/97
Výzkumný záměr: CEZ:AV0Z1010914
Klíčová slova: X-ray optics * X-ray crystal monochromators * inclined diffration
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 0.924, rok: 2000

The measurement of sagittal deviation of an x-ray beam diffracted on the inclined surface of an Si/111/ single crystal was performed on BM5 in ESRF. The results agree with theory published earlier.
Trvalý link: http://hdl.handle.net/11104/0031377