Počet záznamů: 1
The influence of adatom diffusion on coverage and emission current fluctuations
- 1.Tarasenko, A. A., Nieto, F., Jastrabík, L., Uebing, C. The influence of adatom diffusion on coverage and emission current fluctuations. Microelectronics Reliability. 2000, 40(-), 2023-2031. ISSN 0026-2714. E-ISSN 0026-2714.
Počet záznamů: 1