Rezek, Bohuslav - Stuchlík, Jiří - Fejfar, Antonín - Kočka, Jan - Nebel, C. E. - Stutzmann, M.
Characterization of laser pattern a-Si:H thin films by combined AFM/Local Current Measurements.
Physica Status Solidi A. Roč. 170, č. 1 (1998), s. R1-R2. ISSN 0031-8965
Impakt faktor: 0.782, rok: 1998
http://hdl.handle.net/11104/0030757