REZEK, Bohuslav, STUCHLÍK, Jiří, FEJFAR, Antonín, KOČKA, Jan, NEBEL, C. E., STUTZMANN, M. Characterization of laser pattern a-Si:H thin films by combined AFM/Local Current Measurements. Physica Status Solidi A. 1998, 170(1), R1-R2. ISSN 0031-8965.