Vaněček, Milan - Poruba, Aleš - Remeš, Zdeněk - Rosa, Jan - Kamba, Stanislav - Vorlíček, Vladimír - Meier, J. - Shah, A.
Electron spin resonance and optical characterization of defects in microcrystalline silicon.
Journal of Non-Crystalline Solids. 266-269, - (2000), s. 519-523. ISSN 0022-3093. E-ISSN 1873-4812
Grant CEP: GA MŠMT OK 268
Grant ostatní: XE(XC) 4.BPEUJOR3-CT970145
Impakt faktor: 1.269, rok: 2000
http://hdl.handle.net/11104/0030682