Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution

Name: Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
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Rezek, Bohuslav; Stuchlík, Jiří; Fejfar, Antonín; Kočka, Jan

Počet záznamů: 1

Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution

1.

SYSNO	0132433
Název	Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
Tvůrce(i)	Rezek, Bohuslav (FZU-D)_{RID, ORCID} Stuchlík, Jiří (FZU-D)_{RID, ORCID} Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Zdroj.dok.	Applied Physics Letters. Roč. 74, - (1999), s. 1475-1477. - : AIP Publishing
Druh dok.	Článek v odborném periodiku
Grant	KSK1010601 GA AV ČR - Akademie věd
CEZ	AV0Z1010914 - FZU-D
Jazyk dok.	eng
Země vyd.	US
Trvalý link	http://hdl.handle.net/11104/0030459

Počet záznamů: 1