Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution

Name: Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
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Rezek, Bohuslav; Stuchlík, Jiří; Fejfar, Antonín; Kočka, Jan

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Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution

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Rezek, Bohuslav - Stuchlík, Jiří - Fejfar, Antonín - Kočka, Jan
Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution.
Applied Physics Letters. Roč. 74, - (1999), s. 1475-1477. ISSN 0003-6951. E-ISSN 1077-3118
Grant CEP: GA AV ČR KSK1010601
Impakt faktor: 4.184, rok: 1999
http://hdl.handle.net/11104/0030459

Počet záznamů: 1