Zemek, Josef - Hucek, Stanislav - Jablonski, A. - Tilinin, I. S.
Photoelectron escape depth.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 76, - (1995), s. 443-447. ISSN 0368-2048. E-ISSN 1873-2526
Grant CEP: GA ČR GA202/95/0032
Impakt faktor: 1.376, rok: 1995
http://hdl.handle.net/11104/0029882