Počet záznamů: 1
Depth inhomogenity of deposited thin films: Applications to semi-insulating polycrystalline silicon films
- 1.Kučírková, A., Navrátil, K., Zemek, J. Depth inhomogenity of deposited thin films: Applications to semi-insulating polycrystalline silicon films. Thin Solid Films. 1998, 323(-), 53-58. ISSN 0040-6090. E-ISSN 1879-2731.
Počet záznamů: 1