- Characterization of Ag-As-S and Ag-Sb-S amorphous films prepared by p…
Počet záznamů: 1  

Characterization of Ag-As-S and Ag-Sb-S amorphous films prepared by pulsed laser deposition

  1. 1.
    SYSNO ASEP0105578
    Druh ASEPJ - Článek v odborném periodiku
    Zařazení RIVJ - Článek v odborném periodiku
    Poddruh JOstatní články
    NázevCharacterization of Ag-As-S and Ag-Sb-S amorphous films prepared by pulsed laser deposition
    Překlad názvuCharacterizace Ag-As-S a Ag-Sb-S amorfních vrstev připravených pomocí pulsní laserové depozice
    Tvůrce(i) Wágner, T. (CZ)
    Krbal, M. (CZ)
    Gutwirth, J. (CZ)
    Němec, P. (CZ)
    Vlček, M. (CZ)
    Frumar, M. (CZ)
    Peřina, Vratislav (UJF-V) RID
    Macková, Anna (UJF-V) RID, ORCID, SAI
    Hnatowicz, Vladimír (UJF-V) RID
    Kasap, S. O. (CA)
    Zdroj.dok.Surface and Interface Analysis. - : Wiley - ISSN 0142-2421
    Roč. 36, č. 8 (2004), s. 1140-1143
    Poč.str.4 s.
    Jazyk dok.eng - angličtina
    Země vyd.GB - Velká Británie
    Klíč. slovachalcogenide glasses ; thin films ; pulsed laser ablation
    Vědní obor RIVBG - Jaderná, atomová a mol. fyzika, urychlovače
    CEPGA203/02/0087 GA ČR - Grantová agentura ČR
    CEZAV0Z1048901 - UJF-V
    AnotaceThin amorphous films of Ag-As-S and Ag-Sb-S systems have been prepared by pulsed laser deposition (PLD) at five different conditions, i.e. at different pulse energies and pulse repetition intervals of the KrF laser. The obtained films were analysed by RBS, ERDA (elastic recoil detection analysis) spectral analysis and also EDXA elemental analysis. The results of RBS and EDXA analysis were compared to the composition of the source bulk glass materials. Film compositions varied compared to the source material according to the deposition condition with film composition close to the stoichiometric one, i.e. AgAsS2 and AgSbS2 could be prepared by the PLD technique. RBS spectroscopy is known as an important tool for establishing depth distribution of the elements within the prepared films. The thickness of the films was chosen so that depth profiling of the entire layer is possible. ERDA allowed us to find, apart from all obvious atoms (Ag, As, Sb, S), also H atoms present in the films. The structure of the films has been studied by Raman spectroscopy as well. Vibration bands characteristic of As(Sb)S-2-Ag-As(Sb)S-2 structural units present in prepared films have been observed. The films are potentially applicable for optical memories (e.g. digital video discs).
    PracovištěÚstav jaderné fyziky
    KontaktMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Rok sběru2005
Počet záznamů: 1  

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